The Dielectric Assessment Kit for Thin Layers (DAK-TL) allows characterization of the dielectric properties of solid and semi-solid materials with limited thickness (0.1 – 10 mm) that are available in sheet form, and of liquid samples with volumes of 10 – 50 mL. The system, like DAK, is based on open coaxial probes and is equipped with electronics for automatic measurement of thickness and force. The dielectric parameters of the material under test are calculated from the reflection coefficient measured at the probe flange, the probe dimensions (diameters, bead permittivity), and the sample thickness.
System |
DAK-TL2 is composed of the probe beam mounted on the base unit. It is fully automated and software controlled. The sample platform brings the material under test to the probe and measures the sample thickness with micrometer accuracy. The applied force can be precisely controlled to enable high measurement repeatability for soft samples such as leather or soft plastic. |
Application |
Examples of applications include:
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Base Unit
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The DAK-TL2 base unit accommodates the automated sample platform with built-in thickness measurement, the force sensor, and the controlling electronics. The base system is connected to the PC via USB and is fully automated and software controlled. The sample is placed on the sample platform, which brings it to the probe for measurement of the sample thickness with micrometer precision. The base unit is designed for use with all three DAK-TL2 probes.
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DAK12-TL2 (4 - 600 MHz) |
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DAK3.5-TL2 (200 MHz - 20 GHz) |
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DAK1.2E-TL2 (5 - 67 GHz) |
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Calibration |
Calibration according to SPEAG's high-quality standards; DAK probe calibration included within the scope of SPEAG's ISO/IEC 17025 accreditation; suitable for measurements with small and known tolerances. |
Accessories |
SPEAG provides all DAK-TL accessories necessary for high-precision measurements:
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VNA Compatibility |
DAK-TL2 is compatible with the most popular VNAs on the market (please see our list of currently supported VNAs). For further information about our attractive system packages with the VNA from Rohde & Schwarz contact us at info@speag.swiss. |
Software |
The software provides the following functionalities:
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Computer Requirements |
The following computer requirements must be met:
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Unique Features |
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Direct Solver Multilayer Algorithm Python Interface Built-in Thickness Measurement Force Sensor Infinity Ring and Platform Wide range of Dielectric Properties |
Fast and accurate conversion of S11 to dielectric properties using the direct solver which reduces the calculation uncertainties
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Benefits | |
Broad Band Easy to Use Accurate, Repeatable, and Reliable Pressure Dependent Measurements |
Outstanding performance from 4 MHz to 67 GHz over a wide permittivity range Enhanced user experience with improved GUI and software reduce the training time and operational costs, fast semi-automated measurements at a push of a button Measurement uncertainty as a function of frequency, material properties and thickness suitable for measurements with small and known tolerances, improved probe alignment repeatability with new mechanics Optimized probe-sample contact is established with user defined pressure during calibration and measurement; pressure dependent dielectric measurement is possible using DAK-TL2 |
Compatibility |
The DAK-TL2 upgrade kit is compatible with DAK-TL base units with P/N: SM DAK 4P1 DA Note that if your hardware on-site has an older P/N version, upgrades must be performed by SPEAG; in this case please contact info@speag.swiss for further instructions. |
Product History |
DAK-TL is discontinued on August 2020 and succeeded by DAK-TL2 |
Release Date |
2020Q4 |