Millimeter-wave pseudo-vector power density probes

ICEy - Interference & Compatibility Evaluation System

ICEy is the most advanced reactive near-field EM scanning system offering micrometer precision and a high degree of measurement automation. ICEy is the scanning tool of choice for the compliance testing of 5G millimeter wave transmitters as well as for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics.  ICEy provides accurate EM measurements of the device-under-test (DUT) traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results. ICEy is a turnkey testbed that supports all features for precise, user-friendly, efficient, fast, and highly autonomous near-field analyses, developed in close collaboration with industry for the chipset, EM packaging, mobile communications, and medical markets.

Daily support is available directly from your nearest SPEAG representative.

What Are the Unique Features of ICEy?


ICEy is a turnkey system in which all equipment necessary for high-precision EMI/EMC and 5G mm-wave near-field measurements are highly integrated:

  • Optimized near-field EM testbed and robotic scanning system
  • Millimeter-wave pseudo-vector power density probes
  • High-resolution miniature active fiber-optic electric- and magnetic-field probes
  • Camera and 3D DUT surface reconstruction system
  • High-speed EMI/EMC vector signal analyzer
  • High-performance measurement control and post-processing PC
  • System and motion control electronics
  • On-site installation, calibration, and validation by our engineers
  • Measurement-ready after system setup with extensive on-site training by our engineers.
Millimeter Wave Probes
The ICEy-mmWave module enables power density compliance testing as close as 2 mm from any surface for frequencies from 10 up to 110 GHz with minimal uncertainty using the novel EUmmWV2 probe integrated in ICEy with the DAE4ICEy. The module is compatible with all international and national standards, e.g., IEC TC106 AHG10, FCC, etc.

Active Fiber Optic Sensors

With our TDS active fiber-optic sensor technology, we take EMI/EMC near-field probe technology to a new level, introducing the first fully RF-EM transparent EMI/EMC near-field probe technology world-wide:

  • Isolated by fiber-optics, the sensor head is floating and does not perturb the DUT EM field distribution
  • The probes are made from low loss, low dielectric constant material that minimally perturbs the DUT EM field distribution
  • The active sensor design offers unparalleled sensitivity by integrating low noise amplifiers in the probe tip
  • The large RF bandwidth of our TDS systems allows measurements resolved in the time or frequency domains with the same probe that depend only on the measurement receiver settings.
  • With a dynamic range of 130 dB, our TDS system is suitable for the most demanding test applications.
  • The TDS system allows measurement of the EM phasor, i.e., the complex EM vector.
  • The miniaturization of the active optical sensor technology mastered by SPEAG makes our TDS probes superb for high-resolution near-field measurements
Precision ICEy provides μm scan resolutions, fully traceable calibrated equipment, and specified measurement uncertainties for arbitrary sources.
Speed An advanced GUI accelerates measurement and setup by providing efficient guidance for visually planning measurement campaigns based on computer vision support and advanced evaluation libraries. Millions of measurement samples can be acquired within a second. Unparalleled measurement speeds are achieved by integrating the vector signal analyzer directly to the PCI-express bus of the control PC.
Versatility A large scanning volume and a fully screened, anechoic EM environment supports a wide range of near-field scanning applications.
Customization A powerful scripting environment allows the user to control external equipment during the scan and to write custom extensions to the control and postprocessing environment. Hardware components, such as probes, can be customized.
Automation The advanced GUI enables computer-aided measurement setup. Measurements can be planned based on a stereoscopic image of the DUT. High-precision computer vision reconstruction techniques are used to automatically acquire contactless, high-resolution 3D images of the DUT surface structure before the measurement. Fully autonomous actual measurements can be performed with the computer-controlled robotic scanning system.
Calibration ICEy TDS and EUmmW probes are calibrated in our ISO17025 certified laboratory. Traceable calibration and known measurement uncertainties are essential for achieving excellent inter-laboratory comparability of EMI/EMC measurement results and 5G compliance testing. Calibrated validation sources are also available in ICEy for automatic system verification before a measurement campaign, ensuring the reliability of each measurement. Automatic calibration routines and calibration tools for on-site recalibration by the customer also ensure high mechanical integrity for precise alignment of the computer vision surface reconstruction systems.
Support High-level support is available directly from the R&D and advanced application teams in Zurich.

Daily support is available directly from your nearest SPEAG representative.
LASER Safety Classification IEC60825-1 2007 Class 1
US FDA CDRH registration