Swissmade
EVENTS
Sep 23, 2011 - Sep 23, 2011

SPEAG Seminar in Shanghai, September 23, 2011

SPEAG Seminar on New Advances on Standards & Compliance Testing 
Shanghai – Friday, September 23, 2011


Time

Session

Topics

Speaker

9:00–9:30   Registration & coffee  
9:30–9:40   Opening  
9:40–10:00 SAR-1 Current status and future direction of SAR & HAC measurement standards: Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 Dr. Mark Douglas
10:00–10:30 SAR-2 Current status and future direction of Japanese regulations Dr. Nobuhiro Nakanishi
10:30–10:50   Coffee break  
10:50–11:05 4G-1 RFID/NFC  conformance test Dr. Homber Wang
11:05–11:20 4G-2 BT certification Dr. Lv Song Dong
11:20–11:40 SAR-3 Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap- and  whole-body phantoms, and base-station phantoms Prof. Niels Kuster
11:40–12:00 SAR-4 New advances in fast, reliable SAR measurement techniques Dr. Mark Douglas
12:00–12:20 SAR-5 Obtaining high-precision dielectric material characterization of liquids and solids Dr. Mark Douglas
12:20–13:30   Lunch & DAK demo  
13:30–13:45 OTA-1 Current status and future directions of CTIA 3.1 & 3GPP Prof. Niels Kuster
13:45–14:25 OTA-2 Part I – CTIA OTA test system
Part II – APLUSTECH product
Part III – MIMO antenna test
Kyung-ki Min
14:25–14:40 OTA-3 Novel OTA phantoms Prof. Niels Kuster
14:40–15:10 4G-2 NFC testing challenges
  • NFC technology main features
  • NFC testing challenges
  • NFC forum compliance activities
  • RIDER RFID HF tester
Rafael Garcia Escobar
15:10–15:30   Coffee break  
15:30–16:00 4G-3 LTE R&D testing
  • LTE design verification testing
  • Needed functionalities for R&D testing
  • LTE mobile application usage cases
  • LTE RF design validation tester
Rafael Garcia Escobar
16:00–16:20 4G-4 SAR measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) Prof. Niels Kuster
16:20–16:40 HAC-1 Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment  Dr. Fin Bomholt
16:40–17:10 EMI/ESD-1 Next generation of near-field probes and their applications in ESD, EMI, etc. Prof. Niels Kuster
17:10–17:30   Q & A  Annie Yang

    For further information, please contact our local representatives Auden.

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