DAK - Dielectric Assessment Kit Product Line  

What are DAK, DAKS, and DAK-TL?

The Dielectric Assessment Kit (DAK) product line offers high-precision dielectric parameter measurements (permittivityconductivity, loss tangent) over the very broad frequency range from 4 MHz to 67 GHz for applications in the electronic, chemical, food, and medical industries. The probe is connected to a VNA for measurement of the complex reflection coefficient (S11) at the probe end. The measured reflection coefficient is then converted to the complex permittivity of the material under test using DAK software. The product line consists of 1) DAK-TL the first system ever able to measure thin-layer materials and small volumes of liquids. 2) DAK single probes solutions, 3) DAK Systems robust, portable and easy-to-use dielectric measurement system 



DAK-TL2: Dielectric Measurements of Thin Layers and Liquids in Small Volumes

DAK-TL2 is the new Dielectric Assessment Kit for Thin Layers (DAK-TL) developed based on a breakthrough in computational electromagnetics by the IT'IS Foundation for dielectric characterization of samples with limited size or volume. The novel algorithm combined with the upgraded hardware in DAK-TL2, expands the measurement capabilities, and overcomes the limitations of the previous technology, making the system more flexible and more accurate.The DAK-TL family is the first commercially available systems able to measure with high precision the dielectric properties of thin material layers – thickness range from 100 µm to 10 mm –  and  small quantities of liquids (10-50 mL) over a broad frequency range. The system is fully automated and software controlled. Currently, three DAK-TL2 system configurations are offered:

  • DAK12-TL2: 4 MHz – 600 MHz 
  • DAK-3.5-TL2: 200 MHz – 20 GHz
  • DAK-1.2E-TL2: 5 – 67 GHz

The frequency range of the system can be easily extended by adding one or two probe beams.

DAK: Single Probe Solutions for Bulk Materials

The very broad frequency range from 4 MHz to 67 GHz can be covered with only three single probes and without compromise on uncertainty. The probes are mounted on a mounting arm and connected via a high-quality cable to any vector network analyzer (VNA). The main features:

  • probes are manufactured with maximum precision to minimize unwanted reflections
  • probe materials and shapes are optimized to ensure excellent contact with the material under test
  • probes are easy to clean to avoid cross-contamination between probe and material
  • newly developed novel algorithms extend the frequency range of DAK probes down to 4 MHz (DAK-12) and up to 67 GHz (DAK-1.2E) with minimal uncertainty
  • many innovations are integrated into the shorting block for excellent system calibration, which is key for highly accurate and precise measurements


The following three DAK single probe solutions are available:

  • DAK-12: 4 MHz – 3 GHz
  • DAK-3.5: 200 MHz – 20 GHz 
  • DAK-1.2E: 5 – 67 GHz 

DAKS: Simplest Way to Measure Bulk Materials


DAKS is based on the same probe technology as the single probe DAK versions but with the vector reflectometer integrated to eliminates phase distortions due to cable movements, i.e., the probes are moved to the object under test; with a single probe, the probe and cable must remain stationary, which can complicate certain measurements.

Currently, two versions of DAKS are offered:

DAKS-124 MHz – 3 GHz, with integrated vector reflectometer model R60 from Copper Mountain Technologies 

DAKS-3.5: 200 MHz – 14 GHz with integrated vector reflectometer model R140 from Copper Mountain Technologies

DAK-Resonator: Low Loss Material characterisation

DAK-Resonators, available at different frequencies, are high Q structures that resonate at certain frequencie in which the material under test affects the frequency and Q factor of the cavity. Dielectric properties are then calculated from these parameters. DAK resonator extends our capability by adding outstanding measurement accuracy of low-loss materials (loss tangent of 10-5) at discrete frequencies. Resonator data can be combined with the results of DAK-TL to obtain the broad-band continued material characterization.

Release date:  2021Q1

DAK-LF: Low Frequency Measurements

DAK-LF is based on the 4-point impedance measurement to to extend our dielectric measurement capabilities into the kHz range.

Release date:  2021Q3