DAK-R for Accurate Characterization of Low-Loss Dielectrics at Multiple Frequencies
The DAK-R is a cutting-edge solution for non-destructive dielectric measurement of thin, low-loss substrates (0.05 – 3 mm). Resonator methods are the most accurate techniques for determining the dielectric properties of low-loss materials. DAK-R is based on an advanced implementation of split-cylinder resonator (SCR). Unlike conventional SCRs, which operate only at fundamental frequencies, DAK-R features an innovative cavity design paired with a state-of-the-art solver. This suppresses unwanted resonances, extends the permittivity measurement range, and makes DAK-R the only resonator on the market capable of accurate, broadband measurements at 10, 17, 26, 35, and 45 GHz all in a single instrument.
Compliant with IPC test method TM-650 2.5.5.13, DAK-R consists of a cavity divided into two equal halves. A sample is positioned in the gap between these sections, where a TE01n resonance is excited. By analyzing the resonance frequency and quality factor (Q), the relative permittivity and loss tangent of the sample are determined. The resonance frequency of the resonator is a function of the relative permittivity and thickness of the substrate. Thicker substrates and higher values of relative permittivity shift the resonance to lower frequencies.
The DAK-R and DAK-TL2 combo delivers the ultimate solution and sets a new standard for accurate, broadband dielectric characterization.
|
System
|
|
|
Applications |
|
|
Calibration |
Calibration according to SPEAG's high-quality standards; DAK probe calibration included within the scope of SPEAG's ISO/IEC 17025 accreditation; suitable for measurements with small and known tolerances |
|
Sample Requirements |
|
|
Components |
SPEAG provides all necessary components to perform high-precision measurements with DAK-R:
|
|
VNA Compatibility |
DAK-R requires a 2-port measurement and is compatible with the most popular VNAs on the market (please see our list of currently supported VNAs) |
|
Software |
The software provides the following functionalities:
|
|
Computer Requirements |
The software must be run on an external computer, not on the VNA and runs only on 64 bit Windows operating systems. Operating system: Windows 10 or later Minimal hardware requirements:
|
|
Unique Features |
|
|
Novel Cavity combined with Advanced Solver Vertical Cavity Structure High Quality factor Resonator VNA compatibility Wide range of Dielectric Properties Optimal Combination with DAK-TL2 |
Suppressed unwanted resonance for multiple frequency analysis with one cavity Easy handling of samples during measurement Q>25000 for the most accurate loss measurement Similar to other DAK products (requires 2-port) εr: 1–100, tan δ: 0.00001 - 0.01 Offer best-in-class solution to achieve broadband low-uncertainty characterization of dielectric materials |
| Benefits | |
|
Broadband Easy-to-Use Accurate, Repeatable, and Reliable |
The only SCR on the market capable of performing measurements at multiple points with a single cavity Vertical cavity arrangement for easy sample handling Outstanding measurement accuracy and precision |
|
Standard Compatibility |
DAK-R Software is compatible with the IPC test method TM-650 2.5.5.13 |
|
Release Date |
20250304 |
