Jun 12, 2018 - Jun 14, 2018


Exhibition: IEEE MTT-S IMS 2018, Philadelphia, USA

Date: June 12 - 14, 2018

Booth: #1835


The IEEE MTT International Microwave Symposium (IMS) is the premier annual international meeting for technologists involved in all aspects of microwave theory and practice. This year’s IMS2018 Exhibition is the ideal environment to learn about SPEAG’s novel solutions and product features for precise measurements and numerical optimization and analysis in a broad range of applications from 3 kHz ‒ 110 GHz, including:

  • the Dielectric Assessment Kit (DAK) for dielectric characterization up to the millimeter wave range;
  • the novel EUmmWV2 probe and 5G Modules of DASY6 and ICEy-mmW;
  • the ICEy-R module for radiated performance testing from reactive near-field scans;
  • SEMCAD X Matterhorn V17.0 offering many new 5G features with astonishing computational accelerations;
  • EM-Phantoms for 5G millimeter wave applications;
  • the Time Domain Sensor (TDS);
  • MAGPy, the near-field compliance test solution for wireless power transfer from 3 kHz ‒ 10 MHz extending the permitted transmit power;
  • next generation 3D compliance SAR systems (cSAR3D);
  • the fully automated ultra-fast SAR compliance system (cSARD6).


Our on-site-experts will demonstrate our latest developments and answer any technical or purchasing question you may have based on individual requirements and expectations. It will also be a great opportunity to find out more about our current projects and forthcoming releases.

We look forward to welcoming you soon at booth #1835!

The SPEAG Team