IEC/IEEE 63195 has defined a series of complex validation sources to demonstrates that the measurement system can resolve the distribution at close distances.
Description |
Cavity-backed array of dipoles arranged in an offset lattice according to the modes generated into the resonant cavity. The dipoles are printed onto one face of a low-loss dielectric substrate and excited by non-resonant rectangular slots located on the opposite face of the substrate. |
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Specifications |
Cavity-backed array of dipoles: Mechanical tolerance dipole & slots
Mechanical tolerance slots
Substrate tolerances
Associated microwave source
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Standard Compatibility |
IEC/IEEE 63195 |
Description |
This category of reference antenna consists of a pyramidal horn loaded with an array of rectangular slot antennas on the aperture |
Specifications |
Horn loaded with a slot array
Associated microwave source
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Standard Compatibility |
IEC/IEEE 63195 |