SPEAG Releases TDS SNI, a New Line of EMC Sniffing Probes

SPEAG is excited to announce the release of the latest addition to our TDS product family – the TDS SNI probe. With TDS SNI, SPEAG pioneers the use of photonics for accurate and traceable RF measurements in EMC/EMI sniffing applications, bringing the functionality of a benchtop spectrum analyzer to the tip of miniature electrically isolated electric and magnetic field probes.

• Active Photonic TDS Technology: With our active photonic TDS sensor technology, TDS SNI is the first fully RF-EM-transparent EMI/EMC near-field probe technology world-wide for absolute measurement of emissions from your DUT without field distortion and with full vector and phase information.
• Handheld: TDS SNI probes come in a small pen-size format, ideally suited for EMC sniffing and troubleshooting.
• Ultra-Wideband: The TDS SNI probes offer a unique extended frequency range of 10 MHz – 10 GHz.
• High-Resolution: TDS SNI probes offer mm-resolution allowing accurate isolation of interference sources.
• Highly Sensitive, High Dynamic Range: TDS SNI probes are capable of accurate measurements of signals ranging from as low as the environmental GPS to as high as wireless charging applications.
• Traceable Calibration: TDS SNI probes are the first EMC/EMI near-field sniffing probes to deliver traceable measurement results calibrated in our ISO 17025 certified laboratory, for full interlaboratory comparability and total trust in your and your suppliers’ measurement results.

Applications:

These features make SPEAG’s TDS SNI EMI/EMC near-field sniffing probes ideal for a wide range of applications, such as:

• Signal Integrity measurements for modern communication systems such as LTE, WLAN (802.11a/b/g/n), Bluetooth (802.15.1), ZigBee (802.15.4), UWB (802.15.3), WiMAX (802.16), etc.
• EMC/EMI/ESD near-field quantitative measurements and pre-compliance tests for EMC compliance supporting certification according to IEC 60601, EN 55011, CISPR 25, ISO 11452, etc.
• Interference and crosstalk evaluation in highly integrated, high-speed electronic devices and components
• RF electric and magnetic field measurements in EM-harsh environments such as MRI, EMP sites etc.
• Measurement of the full complex-valued vector field in the very close near-field of radiators

Further Information on our TDS SNI products:

For more-detailed information about TDS SNI, please visit:

TDS SNI System Overview

For further information or to receive a quotation, please contact us at: info@speag.swiss.