H-Field TDS Sniffer Probe : H1TDSx SNI, H1TDSz SNI

	H-Field TDS SNI are small-form-factor, hand-held, high-performance probes for magnetic near-field EMC/EMI/ESD sniffing applications. Based on SPEAG's novel TDS technology, each probe incorporates an active optic fully isolated micro-loop sensor that guarantees high sensitivity and high resolution in the 10 MHz – 10 GHz frequency range. Its excellent E-field rejection allows precise H near-field mapping free from undesired E-field contributions. The superior RF EM transparency, due to the absence of conductive parts that could shield or perturb the field under measurement, allows effective and reliable EMC/EMI/ESD pre-compliance tests. All TDS SNI sniffer probes are calibrated in SPEAG’s ISO17025-certified calibration laboratory and are delivered with traceable calibration certificates.
Types of Probes	H1TDSx SNI Single-axis free-space sensor, sensitive to the H-field radial to the probe axis H1TDSz SNI Single-axis free-space sensor, sensitive to the H-field parallel to the probe axis
Frequency Range	10 MHz – 6 GHz 50 MHz – 6 GHz (ISO 17025 certified calibration)
Dynamic Range	120 dB (1 Hz resolution bandwidth) 1 µA/m – ≥1A/m (2 GHz)
E/H Suppression	>20 dB plane-wave equivalent (2 GHz)
Sensor Head Loop Size	2 × 2 mm²
Probe Tip Size	4 × 4 mm²
Optical Probe ID	Integrated in the shutter key handle
Fiber-Optic Interconnect	4 m fiber-optic patch cord fitted to the probe MU8-connector integrated in the shutter key
Fiber-Connector Mating Cycles	500 – 1000 (fiber patch cord can be serviced by SPEAG, increasing total mating cycles to >25,000)
Data Acquisition Systems	SPEAG 1RU1TDS Standalone SPEAG 3RU1TDS Standalone SPEAG 1RU1TDS PXI SPEAG 3RU1TDS PXI SPEAG OH4VNA RU
LASER Safety Classification	IEC60825-1 2007 Class 1 US FDA CDRH registration

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