E-Field TDS Sniffer Probes : E1TDSx SNI, E1TDSz SNI

	E-field TDS SNI are small-form-factor, hand-held, high-performance probes for electric near-field EMC/EMI/ESD sniffing applications. Based on SPEAG's novel TDS technology, each probe incorporates an active optic fully isolated micro-sensor that guarantees high sensitivity and high resolution in the 10 MHz – 10 GHz frequency range. Its excellent magnetic (H-) field rejection allows precise electric (E-) near-field mapping, free from undesired H-field contributions. The superior radio frequency electromagnetic transparency, due to the absence of conductive parts that could shield or perturb the field under measurement, allows effective and reliable EMC/EMI/ESD pre-compliance tests. All TDS SNI sniffer probes are calibrated in SPEAG’s ISO17025-certified calibration laboratory and are delivered with traceable calibration certificates.
Types of Probes	E1TDSx SNI Single-axis free-space sensor, sensitive to E-fields radial to the probe axis E1TDSz SNI Single-axis free-space sensor, sensitive to E-fields parallel to the probe axis
Frequency Range	10 MHz – 6 GHz 50 MHz – 6 GHz (ISO 17025 certified calibration)
Dynamic Range	120 dB (1 Hz resolution bandwidth) 0.3 mV/m – ≥150 V/m
Sensor Head Dipole Size	2.8 mm
Probe Tip Size	4 × 4 mm²
Optical Probe ID	Integrated in the shutter key handle
Fiber-Optic Interconnect	4 m fiber-optic patch cord fitted to the probe MU8-connector integrated in the shutter key
Fiber-Connector Mating Cycles	500 – 1000 (fiber patch cord can be serviced by SPEAG, increasing total mating cycles to >25,000)
Data Acquisition Systems	SPEAG 1RU1TDS Standalone SPEAG 3RU1TDS Standalone SPEAG 1RU1TDS PXI SPEAG 3RU1TDS PXI SPEAG OH4VNA RU
LASER Safety Classification	IEC60825-1 2007 Class 1 US FDA CDRH registration

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