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PROBES
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E1TDS SNI - TDS E-Probes

E-Field TDS Sniffer Probes : E1TDSx SNI, E1TDSz SNI

E-field TDS SNI are small-form-factor, hand-held, high-performance probes for electric near-field EMC/EMI/ESD sniffing applications. Based on SPEAG's novel TDS technology, each probe incorporates an active optic fully isolated micro-sensor that guarantees high sensitivity and high resolution in the 10 MHz – 10 GHz frequency range. Its excellent magnetic (H-) field rejection allows precise electric (E-) near-field mapping, free from undesired H-field contributions. The superior radio frequency electromagnetic transparency, due to the absence of conductive parts that could shield or perturb the field under measurement, allows effective and reliable EMC/EMI/ESD pre-compliance tests. All TDS SNI sniffer probes are calibrated in SPEAG’s ISO17025-certified calibration laboratory and are delivered with traceable calibration certificates.
Types of Probes

E1TDSx SNI
Single-axis free-space sensor, sensitive to E-fields radial to the probe axis

E1TDSz SNI
Single-axis free-space sensor, sensitive to E-fields parallel to the probe axis

Frequency Range

10 MHz – 6 GHz

50 MHz – 6 GHz (ISO 17025 certified calibration)

Dynamic Range

120 dB (1 Hz resolution bandwidth)
0.3 mV/m – ≥150 V/m

Sensor Head Dipole Size 2.8 mm
Probe Tip Size 4 × 4 mm2
Optical Probe ID Integrated in the shutter key handle
Fiber-Optic Interconnect

4 m fiber-optic patch cord fitted to the probe
MU8-connector integrated in the shutter key

Fiber-Connector Mating Cycles 500 – 1000 (fiber patch cord can be serviced by SPEAG, increasing total mating cycles to >25,000)
Data Acquisition Systems

SPEAG 1RU1TDS Standalone
SPEAG 3RU1TDS Standalone

SPEAG 1RU1TDS PXI
SPEAG 3RU1TDS PXI

SPEAG OH4VNA RU

LASER Safety Classification IEC60825-1 2007 Class 1
US FDA CDRH registration